- #What is a agilent 3070 ict test systems upgrade#
- #What is a agilent 3070 ict test systems software#
- #What is a agilent 3070 ict test systems Pc#
- #What is a agilent 3070 ict test systems windows#
Of boundary-scan access to a large portion of the digital nets on the boardĪbility to test analog portions of the UUT using inherent 3070 capabilities The combined test system delivers the following benefits: Reduced fixture complexity and cost as a result Boundary-scan signals are isolated from the in-circuit tests by means of a buffer card assuring signal integrity throughout your test program. Diagnostics of detected faults are fully supported by the JTAG Technologies BSD software, often with pin-level accuracy.įigure 2 is a block diagram of the system, showing the JTAG Technologies Ethernet based boundary-scan hardware controller (JT 37x7/TSI) installed at the Agilent 3070 system.
#What is a agilent 3070 ict test systems software#
There, the applications run within the 3070 environment on one of the proven JTAG Technologies hardware controllers and genuine JTAG Technologies software for the highest execution performance. Tests and in-system programming applica-tions are generated on JTAG Technologies industry-leading development tools and easily ported to the 3070 production system. Of both boundary-scan and ICT without disrupting your existing test methodology. The JTAG Technologies SolutionSymphony for 3070 by JTAG Technologies is unique in its architecture, delivering the benefits
#What is a agilent 3070 ict test systems upgrade#
High production line throughput for testing and in-system programming including extremely fast flash memory programmingĬost of ownership and needed capital investments are low compared with traditional structural test methodsīoundary-Scan Upgrade for In-Circuit Test Systems Negligible impact on board real estate requirements, with a high degree of design flexibility Unlimited number of boundary-scan test points and scan chains Highly effective tools to analyze test coverage The boundary-scan products of JTAG Technologies lead the industry in delivering powerful benefits to the designer and test engineer: High degree of automation in testĭevelopment, in-system programming applications and fault diagnosis In thousands of manufacturing facilities around the world, boundary-scan, often in combination with ICT, has been proven to be extremely effective even on the most crowded PCBs. 1149.1, has been widely adopted by leading manufacturers to perform testing and in-system programming of flash memories and PLDs on digital circuit boards. Ethernet-based JTAG Symphony integration for Agilent 3070 ICTsīenefits of boundary-scan testing on high-density boardsBoundary-scan testing, based on the IEEE Std. These trends are causing test professionals to look for effective and budget-minded solutions, often by combining available test techniques in an optimized test strategy for maximum value.įig.
ICT misses an increasing percentage of defects, delaying detection and correction until later in the production process, and thereby weakening the effectiveness of process control.Īs a result, more faults must be found in functional testing, requiring highly skilled engineering resources for test development and bone-pile resolution. As a result, the test coverage on complex boards is decreasing, resulting in several undesirable and costly outcomes: To catch up with the IC device packaging technology, ICT test fixtures are becoming more complex, more expen. For digi tal target boards, fixture-based in-circuit test systems are bumping against their limits in terms of the number of available test nodes, inadequate spacing between test points, and inaccessible nodes underneath ball-grid array packages and within inner board layers. The Impact of High-Density PCB Design on In-Circuit TestingAs electronics designers continue to drive greater densities onto their printed circuit boards, testing for the occurrence of manufacturing faults becomes an increasingly difficult challenge for the test engineers.
#What is a agilent 3070 ict test systems Pc#
Interchangeability of application files between PC and UNIX environ-ments for application development and executionįast flash programming with easy S-record, Intel Hex file and binary updatesĬPLD programming without compiling and debugging numerous PCF routinesĮasy to retrofit to existing fixtures and programs
#What is a agilent 3070 ict test systems windows#
JTAG Technologies boundary-scan capability on Agilent 3070 in-circuit test (ICT) systemsĬombination of boundary-scan with ICT simplifies test fixtures and increases test coverageĮthernet and PCI interfaces available for universal compatibility with all 3070 UNIX controllers and PC-based Windows systems Universal Boundary-Scan Upgrade for Agilent 3070 UNIX- and PC-based In-Circuit Testers
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